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An innovative in situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline

Aljoša Hafner,Luca Costa,George Kourousias,Valentina Bonanni,Milan Žižić,Andrea Stolfa,Benjamin Bazi,Laszlo Vincze,Alessandra Gianoncelli
Analyst Pub Date : 11/23/2023 00:00:00 , DOI:10.1039/D3AN01358H
Abstract

Multimodal imaging and spectroscopy like concurrent scanning transmission X-ray microscopy (STXM) and X-ray fluorescence (XRF) are highly desirable as they allow retrieving complementary information. This paper reports on the design, development, integration and field testing of a novel in situ atomic force microscopy (AFM) instrument for operation under high vacuum in a synchrotron soft X-ray microscopy STXM–XRF end-station. A combination of μXRF and AFM is demonstrated for the first time in the soft X-ray regime, with an outlook for the full XRF–STXM–AFM combination.

Graphical abstract: An innovative in situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline
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